Multi-Point Boundary Tracking For Atomic Force Microscopy

This paper presents several approaches for efficient imaging on the atomic force microscope (AFM) using boundary tracking. In addition to the refinement and generalization of existing algorithms such as those of Andersson [1][2] and Chen [3] , a new multi-point model is proposed. In this model, variables are calculated according to a set of consecutive measurements rather than updated on a point-by-point basis. Simulations on MATLAB, as well as techniques and challenges for actual implementation on the AFM, are also discussed.